Presentation Title
Room Temperature Growth of Organic Ferroelectric Croconic Acid Thin Films
Presentation Type
Oral Presentation
College
College of Natural Sciences
Major
Physics
Session Number
2
Location
RM 216
Faculty Mentor
Dr. Sara Callori
Start Date
5-18-2017 3:30 PM
End Date
5-18-2017 3:50 PM
Abstract
In material science, ferroelectric materials have demonstrated diverse applications to non-volatile memory, energy harvesting, and optics. Currently, there is a higher demand for organic ferroelectrics due to their greater efficiency and economic scalable production. In order to access feasible alternatives for current inorganic ferroelectrics, the fabrication of organic ferroelectric thin films is essential. One promising material is croconic acid, which has a relatively large ferroelectric polarization. Thin films of croconic acid can be prepared via thermal vapor depositions, where the bulk material is evaporated in an ultra-high vacuum system onto a substrate. Here, we present results on room temperature growth of crononic acid films using this method. The films were prepared on various substrates and the thickness and quality were measured using the Atomic Force Microscope (AFM).
Room Temperature Growth of Organic Ferroelectric Croconic Acid Thin Films
RM 216
In material science, ferroelectric materials have demonstrated diverse applications to non-volatile memory, energy harvesting, and optics. Currently, there is a higher demand for organic ferroelectrics due to their greater efficiency and economic scalable production. In order to access feasible alternatives for current inorganic ferroelectrics, the fabrication of organic ferroelectric thin films is essential. One promising material is croconic acid, which has a relatively large ferroelectric polarization. Thin films of croconic acid can be prepared via thermal vapor depositions, where the bulk material is evaporated in an ultra-high vacuum system onto a substrate. Here, we present results on room temperature growth of crononic acid films using this method. The films were prepared on various substrates and the thickness and quality were measured using the Atomic Force Microscope (AFM).