Document Type

Conference Proceeding

Publication Date

2019

Publication Title

AIP Conference Proceedings

Volume

2182

Issue

1

First Page

050022

Last Page

050022

ISSN

1551-7616

DOI

https://doi.org/10.1063/1.5135865

Keywords

Particle beams, Ferroelectric materials, Electrostatics, Doppler effect, Thin films, Spectroscopy

Abstract

Croconic acid (CA) is the first organic ferroelectric with a spontaneous polarity in bulk samples comparable to its inorganic counterparts. As a natural extension of study, ultrathin CA films (∼nm scale) were investigated to reveal ferroelectric effects in films on different substrates for their fundamental and industrial significance. However, the void defect at the interface between the film and substrate is presumed to interfere with surface effects. In this work, a non-invasive technique, a slow positron beam, coupled with Doppler broadening energy spectroscopy (DBES), is applied to study the void defects within the interfacial layer between CA films and Si and SiO2 substrates. The effect of external electric field on defect formation is also investigated and an underlying mechanism is proposed.

Rights

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Peterson, D., Liu, J., Guzman, F., Etzweiler, J., Santoyo, G., Murphy, S., Callori, S. J., Cousins, K., Usher, T., Zhang, R., & Selim, F. (2019). Studying the interface between croconic acid thin films and substrates using a slow positron beam. AIP Conference Proceedings, 2182(1), 050022, and may be found at https://doi.org/10.1063/1.5135865

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